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Tescan
biography:
TESLA used to be the leading supplier of electron-optical devices and
electronic measuring instruments in Eastern Europe and so TESCAN follows up with
this activities taking advantage of the long-year-experience of the best
specialists. The close co-operation with universities and scientific institutes
is another strength of the company.

TESCAN was awarded (recognized) as an innovative company of the year in the
Czech Republic of the year 1994. TESCAN succeeded in several research projects
granted by European Community or Czech government (Copernicus, Technos, etc.).


In order to make use of the advantages of own mechanical workshop, TESCAN
launched the machine tool manufacturing for German clients. This made possible
to equip the workshop with new, high precision machinery. The position of the
company strengthened in 1996 when TESCAN purchased own real property.
 
Since
1993, Nouavar Shad Co., has provided high quality, dependable scanning electron
microscopy products and services. Representing one of the world’s premier
manufacturers "Tescan a.s.", Tescan offers an exceptional range of scanning
electron microscopes - from compact, economical models to ultra-high performance
research grade instruments. And with a nationwide team of experienced service
engineers, you’re assured of fast, expert support for the life of your SEM.
Types of scanning
electron microscopes:
- Vega
Normal Tungsten base Scanning Electron Microscope
- Mira
High Resolution FE GUN Scanning Electron Microscopes
VEGA 3 Scanning Electron Microscopes

The Third generation TESCAN Series is a family of state-of-the-art, fully PC-controlled SEMs with a host of advanced features:
Exclusive 4-lens Electron Optics provide crisp, high resolution images, as well as ultra-low magnification and ultra-high depth of focus imaging modes
Sophisticated, easy to use software for microscope control using Microsoft Windows™
7 Professional.
Password-protected, Multi-level User Accounts - Ideal for multi-user labs
Clean, fast turbo molecular pumping
A wide range of chambers and specimen stages
Extensive computer automation of SEM setup and control functions
Comprehensive software for image archiving, measurements, processing, and analysis
Built-in Remote Operation and Remote Diagnostics
Excellent analytical geometry for EDX, WDX, EBSD analysis
Extensive use of different Detectors:
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- SE, Secondary Electron Detector creates Topographic information of the sample
surface.
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- BSD Back Scattered Electron Detector Back Scattered Electron Detector useful
to get Phase information of the sample surface.
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- 4QBSD 4 quadrant back scattered electron detector
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- CL Cathodoluminescence Detector
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- TE Transmission Electron Detector , useful to investigate for biological &
Polymeric thin samples.
Very competitive price/performance ratio
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MIRA Schottky Field Emission Scanning Electron Microscope

TESCAN is proud to announce the launch of the new Mira series of field emission scanning electron microscopes. The Mira FE SEM uses a high brightness Schottky-emitter for high-resolution / high-current / low-noise imaging, that also provides excellent stability for high-throughput large-area automation, like automated particle analyses. The Mira employees a unique Wide Field Optics™ design offering a variety of imaging modes that use the Tescan proprietary Intermediate Lens for beam aperture optimization. The Mira also uses real-time In-Flight Beam Tracing™ for performance and spot optimization. The Mira shares the control system used in Tescan’s Vega-II, tungsten-emitter SEM which includes: a Wide Field Optics™ column with Fisheye and depth mode imaging, fully automated set-up and alignment of the electron gun and column, and an integrated suite of imaging software designed for multiple user environments that includes functions for acquisition, archiving, measurement, analysis and reporting of images and data. Network and remote SEM operation are standard functions on every Tescan SEM.
 
Each Mira and Vega 3 SEM includes a Back-channel diagnostics system that monitors several hundred points throughout the microscope allowing Tescan engineers to keep each instrument running at peak performance.
Summary Specifications
- Mira LMH High Vacuum FESEM
- Mira LMU Variable Pressure FESEM
Resolution 1.2nm at 30kV , 1.0nm at 30kV (Hi-vacuum)
<2.5nm at 30kV (Low vacuum)
Electron Optics 3-lens Optics, Resolution, Depth, Field, Wide Field& Rocking
Beam Imaging Modes
Magnification 3x to 1,000,000x continuous zoom
Accelerating Voltage 500V to 30kV
Probe Current 2pA to 100nA
Scanning
Image Sizes
Microscope Control & Automation Fully PC controlled under Microsoft Windows™
7. Extensive automation of SEM setup and control functions.
Remote Control Standard Remote Control and Remote Diagnostics
Specimen Chamber
Specimen Stage 5-axis Motorized stage
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you can see www.TESCAN.com
Tescan, a.s.
Libusina tr. 21
623 00 Brno
Czech Republic
Tel: +420 547130411
Fax: +420 547130415
web: http://www.tescan.com
Email:
info@tescan.cz
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