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NS Consultant, Installation & Service of Scientific Research & Laboratorial Systems

X-RAY Apparatus for Analysis

X-ray diffraction System
X-ray diffraction (XRD) is a non-destructive technique for the qualitative and quantitative analysis of the crystalline materials, in form of powder or solid. Basically XRD is obtained as the "reflection" of an X-ray beam from a family of parallel and equally spaced atomic planes, following the Bragg's law: when a monochromatic X-ray beam with wavelenght λ is incident on lattice planes with an angle q , diffraction occurs if the path of rays reflected by successive planes (with distance d) is a multiple of the wavelenght λ is the wavelenght of the radiation coming from the X-ray tube. With a Goniometer, it is possible to analyze the d spacing of a crystal (or a powder) by measuring the first-order angles of diffraction

X-ray Diffraction instruments:

APD2000 Pro
HRD 3000
MPD 3000
IPD 3000,
X-RED 3000,
STRESS-X 3000
ExplorerX

X-ray Fluorescence Spectrometers:

TX2000
Qualitax

TX 2000

The TX2000 is the unique spectrometer that allows to perform Energy Dispersive X-Ray Fluorescence Analysis in both Total Reflection and Traditional (45 degrees) Geometry.

Principal advantages of TXRF

No matrix effects
A single internal standard greatly simplifies quantitative analyses
Calibration and quantification independent from any sample matrix
Simultaneous multi-element ultra-trace analysis
Several different sample types and applications
Minimal quantity of sample required for the measurement (5 m l)
Unique microanalytical applications for liquid and solid samples
Excellent detection limits (ppt or pg) for all elements from sodium to plutonium
Excellent dynamic range from ppt to percent
Possibility to analyze the sample directly without chemical pretreatment
No memory effects
Non destructive analysis
Low running cost

The new dimension in X-ray diffraction

The HRD 3000 high resolution diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows 98/ME operating system. Exact angular positions of the goniometer circles are guaranteed by a well-devised combination of stepping motors and optical encoders. The goniometer circles are positioned at high speed.
The HRD 3000 diffractometer system can be used on a wide range of analytical problems, from texture to thin film analysis, strain measurements and reflectometry.
With this high performance, high resolution diffractometer, you can obtain outstanding results with amazing ease, when determining layer thickness and composition in semiconductors. The high resolution reflectometry studies can be performed with the HRD 3000 to characterise layer thickness, density, surface and interface roughness.
Seven independent degrees of movement freedom, allowing every possible sample position.
The high efficiency of the various components permits analytical results of high quality.
Different kind of source and optical components, several detectors and special attachments can be added to meet all your requirements. You have the choice of a large number easily mounted components. For more information on our system, attachments, and custom design accessories, contact us directly.
Powerful, user-friendly software makes measurement easier than ever and includes many sophisticated features to aid in the interpretation of the results.

HRD 3000

The latest diffraction system manufactured by Ital Structures for material research and development

X-RED 3000

Another approach to X-ray diffraction

Many scientist are studying phase transitions of materials, in order to understand their properties. Other physical methods can be used, but only diffraction is able to provide information on the global structure of the compound. One common problem is the control, during the acquisition time, of phase changes in the sample. Using X-RED 3000, from the beginning of the run, the user can visualised the entire diffractogram, practically in real time; so that a sample evolution is immediately visible.

The X-RED 3000 offers solutions for a wide range of analytical problems, from routine qualitative and quantitative analysis, to residual-stress analysis, non-ambient analyses, retained austenite quantification, crystallite size/lattice strain and crystallinity calculations, phase transitions and transformations, kinetics & non-equilibrium phenomena.